The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2016

Filed:

Sep. 24, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Inventor:

Mu-Hui Park, Hwaseong-Si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 13/00 (2006.01); G11C 16/26 (2006.01); G11C 7/06 (2006.01); G11C 5/06 (2006.01); G11C 11/56 (2006.01); G11C 7/14 (2006.01);
U.S. Cl.
CPC ...
G11C 13/004 (2013.01); G11C 11/5642 (2013.01); G11C 11/5678 (2013.01); G11C 13/0002 (2013.01); G11C 13/0004 (2013.01); G11C 7/14 (2013.01); G11C 16/26 (2013.01); G11C 2013/0045 (2013.01); G11C 2013/0054 (2013.01); G11C 2013/0057 (2013.01); G11C 2213/71 (2013.01);
Abstract

A method of sensing multi-bit data stored in a resistive memory cell includes; determining a resistive value range for the memory cell by performing a first read operation using a first read voltage and a first reference current, determining whether the multi-bit data stored in the resistive memory cell has a first program state, upon determining that the multi-bit data stored does not have the first program state, selecting a second read voltage different from the first read voltage in response to the resistive value range of the resistive memory cell, and using the second read voltage to again determine whether the multi-bit data stored in the resistive memory cell has the first program state.


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