The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Feb. 12, 2014
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Badih El-Kareh, Cedar Park, TX (US);

Leonard Forbes, Corvallis, OR (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/04 (2006.01); H01L 21/28 (2006.01); H01L 27/115 (2006.01); H01L 29/66 (2006.01); H01L 29/788 (2006.01); G11C 16/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/0408 (2013.01); G11C 16/10 (2013.01); H01L 21/28273 (2013.01); H01L 27/115 (2013.01); H01L 27/11521 (2013.01); H01L 27/11524 (2013.01); H01L 29/66825 (2013.01); H01L 29/7881 (2013.01);
Abstract

Methods of programming and forming memory devices. Methods of programming include biasing a control gate of a selected memory cell of the memory device to a first voltage, the control gate being over a first conductive region having a first conductivity type and the first conductive region being over a second conductive region having a second conductivity type different than the first conductivity type; biasing the second conductive region to a second voltage to forward bias the junction from the second conductive region to the first conductive region; and injecting electrons into a charge-storage node of the selected memory cell from the second conductive region. The first conductive region and the second conductive region are contained within a dielectric isolation structure in which at least the selected memory cell is contained.


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