The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Apr. 18, 2012
Applicants:

Seung Bum Suh, Yongin-si, KR;

Heekwan Chai, Yongin-si, KR;

Jeongsoon Shin, Yongin-si, KR;

Younghwa Ko, Yongin-si, KR;

Bounggun Joung, Yongin-si, KR;

Kwangki Baeg, Yongin-si, KR;

Cheol Ho Park, Yongin-si, KR;

Yongsic Kim, Yongin-si, KR;

Wonseok Kim, Yongin-si, KR;

Hoyul Baek, Yongin-si, KR;

Jang-woo Lee, Yongin-si, KR;

Jake Kim, Yongin-si, KR;

Jongman Kim, Yongin-si, KR;

Su Dong Lee, Yongin-si, KR;

Seung Ho Yang, Yongin-si, KR;

Inho Jung, Yongin-si, KR;

Joo Han Song, Yongin-si, KR;

Kyeong-beom Cheong, Yongin-si, KR;

Inventors:

Seung Bum Suh, Yongin-si, KR;

Heekwan Chai, Yongin-si, KR;

Jeongsoon Shin, Yongin-si, KR;

Younghwa Ko, Yongin-si, KR;

Bounggun Joung, Yongin-si, KR;

Kwangki Baeg, Yongin-si, KR;

Cheol Ho Park, Yongin-si, KR;

Yongsic Kim, Yongin-si, KR;

Wonseok Kim, Yongin-si, KR;

Hoyul Baek, Yongin-si, KR;

Jang-Woo Lee, Yongin-si, KR;

Jake Kim, Yongin-si, KR;

Jongman Kim, Yongin-si, KR;

Su Dong Lee, Yongin-si, KR;

Seung Ho Yang, Yongin-si, KR;

Inho Jung, Yongin-si, KR;

Joo Han Song, Yongin-si, KR;

Kyeong-Beom Cheong, Yongin-si, KR;

Assignee:

Samsung SDI Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3679 (2013.01); G01R 31/36 (2013.01); G01R 31/3606 (2013.01); G01R 31/3648 (2013.01); G01R 31/3651 (2013.01);
Abstract

Embodiments of the present invention provide an accelerated lifetime estimation device for predicting the lifetime of a secondary battery, and a method thereof. The accelerated lifetime estimation device can accurately estimate a normal lifetime of the secondary battery while reducing an evaluation time period of the secondary battery.


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