The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Jun. 07, 2013
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Masahiro Okanojo, Tokyo, JP;

Hideyuki Noda, Tokyo, JP;

Shinichi Fukuzono, Tokyo, JP;

Kunio Harada, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/40 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/4077 (2013.01); B01L 3/5635 (2013.01); B01L 2300/0681 (2013.01); B01L 2400/0487 (2013.01); G01N 2001/4088 (2013.01);
Abstract

It has been difficult to conduct high-sensitivity, high-precision measurement due to externally generated contamination or cross-contamination. Thus, the invention includes (1) a filter unit having a filter at a bottom of a container for holding a liquid, the filter being adapted to filter a liquid, and (2) an attachment cover having a first opening and a second opening, the filter unit being attachable to and detachable from the attachment cover via the first opening, and the attachment cover being adapted to, when the filter unit is attached to the attachment cover, allow filtration by the filter in a state in which an inner face of the attachment cover is tightly in contact with an outer face of the filter unit, and discharge a resulting filtrate through the second opening.


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