The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Feb. 13, 2013
Applicants:

A School Corporation Kansai University, Suita-shi, Osaka, JP;

Nissan Chemical Industries, Ltd., Tokyo, JP;

Inventors:

Ryuichi Arakawa, Suita, JP;

Hideya Kawasaki, Suita, JP;

Tomoyuki Ozawa, Funabashi, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); B82Y 30/00 (2011.01); A01N 25/00 (2006.01); A01N 47/40 (2006.01); G01N 1/28 (2006.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); A01N 25/00 (2013.01); A01N 47/40 (2013.01); B82Y 30/00 (2013.01); G01N 1/28 (2013.01); H01J 49/26 (2013.01); B82Y 40/00 (2013.01); G01N 1/2853 (2013.01);
Abstract

The present invention provides an improved method for imaging mass spectrometry using an ionization-assisting matrix of a test sample, wherein the ionization efficiency is high, migration and visual information reduction are inhibited, no interference peaks originating from the matrix occur, and the analysis can be performed at high spatial resolution. Specifically, the present invention provides a method for imaging mass spectrometry using a sample prepared by physical vapor depositing platinum nanoparticles on the surface of a test sample to be subjected to imaging mass spectrometry.


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