The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Apr. 17, 2015
Applicant:

Infineon Technologies Austria Ag, Villach, AT;

Inventors:

Clemens Ostermaier, Villach, AT;

Gerhard Prechtl, St. Jakob i. Rosental, AT;

Oliver Haeberlen, Villach, AT;

Hans Peter Felsl, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/338 (2006.01); H01L 29/778 (2006.01); H01L 29/66 (2006.01); H01L 29/40 (2006.01); H01L 29/417 (2006.01); H01L 29/423 (2006.01); H01L 29/20 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 29/15 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66462 (2013.01); H01L 21/0254 (2013.01); H01L 21/30604 (2013.01); H01L 29/2003 (2013.01); H01L 29/407 (2013.01); H01L 29/41725 (2013.01); H01L 29/4236 (2013.01); H01L 29/778 (2013.01); H01L 29/7783 (2013.01); H01L 29/155 (2013.01); H01L 29/41766 (2013.01); H01L 29/42368 (2013.01);
Abstract

A method of manufacturing a transistor device includes forming a semiconductor heterostructure including a plurality of alternating two-dimensional electron gasses (2DEGs) and two-dimensional hole gasses (2DHGs) extending in parallel at different depths in the semiconductor heterostructure, the 2DEGs forming current channels of the transistor device, forming a source extending into the semiconductor heterostructure in contact with the 2DEGs at a first end of the current channels, forming a drain extending into the semiconductor heterostructure in contact with the 2DEGs at an opposing second end of the current channels, and forming a plurality of spaced apart gate structures extending into the semiconductor heterostructure and including an electrically conductive material separated from the surrounding semiconductor heterostructure by an insulating material.


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