The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Sep. 09, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Thomas Kemen, Aalen, DE;
Pascal Anger, Aalen, DE;
Dirk Zeidler, Oberkochen, DE;
Gerd Benner, Aalen, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A particle optical system comprises a beam generating system () configured to generate a plurality of particle beams () and to direct the plurality of particle beams () onto an object plane (), a first deflector arrangement () arranged in the beam path of the particle beams () upstream of the object plane () and configured to deflect the plurality of particle beams () before they are incident on the object plane (), an object holder () configured to hold an object () to be inspected in the object plane (), a plurality of detectors () configured to receive and to detect the plurality of particle beams () having traversed the object plane (), wherein the detectors are arranged in a detection plane () on a side of the object plane () opposite to the beam generating system (), at least one first particle optical lens () configured to collect particles of the particle beams emanating from the object plane on the detectors (), and a controller () configured to control the first deflector arrangement () in order to deflect locations of incidence () of the particle beams () on the object plane () by deflecting the particle beams ().