The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Sep. 30, 2014
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Min-Ching Lin, Zhubei, TW;

Kenny Ferguson, Edinburgh, GB;

Ming Yi Fang, Hsin-Chu, TW;

SSU-Ping Ko, Hsin-Chu, TW;

Assignee:

Cadence Design System, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5077 (2013.01);
Abstract

A system and method for optimizing a design layout by identifying features for abutment where shapes of the features that trigger the abutment are overlapping or within a predefined proximity of each other. The abutment process is implemented for features that have overlapping pins or that will have overlapping pins when abutted. Connectivity of abutted features is analyzed for the overlapped pins; pins of one of the abutted features are swapped so that at least one overlapping set of horizontal pins is connected to a same net; and a pin of the abutted features can be shortened as necessary to prevent short-circuit between pins connected to different nets. The overlapping pins are then merged. Pins can be shortened by cutting the pin or by adjusting pin style or pin size.


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