The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Nov. 07, 2014
Applicant:

Cadence Design Systems, Inc.;

Inventors:

Dan Leibovich, Modiin, IL;

Tal Yanai, Tel Mond, IL;

Paul Carzola, Wylie, TX (US);

Jigar Patel, Murphy, TX (US);

Assignee:

CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3676 (2013.01);
Abstract

A method, system and non-transitory computer readable storage medium for coverage determination of DUT tests. The method may include obtaining via an input device a selection of a subset of interest of coverage reports included in one or a plurality of saved merged coverage reports. The method may further include using a processing unit, finding a saved merged coverage report of said one or a plurality of saved merged coverage reports that has the smallest number of unwanted coverage reports. The method may also include using the found saved merged coverage report to obtain a merged coverage report that corresponds to the subset and merging the merged coverage report with the newly gathered coverage reports into a new merged coverage report.


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