The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Jan. 22, 2013
Applicant:

Lite-on IT Corporation, Taipei, TW;

Inventors:

Chia-Hao Hsu, Hsinchu, TW;

Chun-Lai Hsiao, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/0833 (2013.01); G02B 26/10 (2013.01);
Abstract

An image projection method and a microelectromechanical system (MEMS) image projection apparatus are provided. The image projection method controls a MEMS scanning mirror swinging around a first swing axis to project an image light beam. The image projection method includes following steps. A resonance frequency and a damping coefficient of the MEMS scanning mirror at swinging are measured to calculate a first amplitude scale and a first maintaining period, and a periodic wave signal is generated accordingly. The periodic wave signal is output to the MEMS scanning mirror for controlling the MEMS scanning mirror to swing, and a swing speed error thereof is recorded. By adjusting the first amplitude scale and the first maintaining period, the periodic wave signal is also adjusted, and the corresponding swing speed error is recorded. According to the recorded swing speed errors, the corrected periodic wave signal is generated for controlling the MEMS scanning mirror.


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