The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Aug. 30, 2011
Valentin Gherman, Palaiseau, FR;
Yannick Bonhomme, Breuillet, FR;
Valentin Gherman, Palaiseau, FR;
Yannick Bonhomme, Breuillet, FR;
Abstract
A device for monitoring the latency of electronic circuits based on microtechnology and/or nanotechnology, said circuits to be tested being supplied with the aid of a voltage Vdd, having a low level and a high level, for the detection of delay faults of said circuits, comprises: at least one device of type I placed between the high level of the power supply voltage and the elements of the circuit to be tested, and/or at least one device of type II placed between the low level of the power supply voltage of the elements of the elements of said circuit to be tested, the device of type I and the device of type II comprising at least one low-latency electrical path, said low-latency path being connected in parallel with a high-latency electrical path, a test signal monitoring the opening of the low-latency paths while the high-latency electrical paths are open.