The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Jul. 31, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Johannes Winterot, Jena, DE;
Thomas Milde, Jena, DE;
Max Funck, Weimar, DE;
Toufic Jabbour, Aalen, DE;
Johannes Knoblich, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a method for calibrating an optical instrument which comprises at least a motorized zoom system, an objective, an image sensor and an image processing unit. The method comprises the following steps: establishing calibration data Dof the zoom system with a reference objective and storing these in an internal memory of the zoom system; establishing calibration data Dof the objective with a reference zoom system and storing these in an internal memory of the objective; reading the internal memories of the zoom system and of the objective and applying a digital-optical correction of an image acquired by an image sensor with the calibration data Dand D. The invention moreover relates to an optical instrument, in particular a digital microscope, to which the calibration method according to the invention can be applied.