The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
May. 22, 2012
Sayaka Sarwar, Tokyo, JP;
Tatsuya Tokunaga, Tokyo, JP;
Miki Taki, Tokyo, JP;
Toshihide Orihashi, Tokyo, JP;
Hiroki Mori, Tokyo, JP;
Yoichi Aruga, Tokyo, JP;
Takashi Nakasawa, Tokyo, JP;
Sayaka Sarwar, Tokyo, JP;
Tatsuya Tokunaga, Tokyo, JP;
Miki Taki, Tokyo, JP;
Toshihide Orihashi, Tokyo, JP;
Hiroki Mori, Tokyo, JP;
Yoichi Aruga, Tokyo, JP;
Takashi Nakasawa, Tokyo, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
An automatic analyzer enables users to perform working steps easily and reliably by switching a display screen irrespective of a skill level of the user. The automatic analyzer, which determines a consistency of a test item, includes a display/input section to display a plurality of working steps relating to necessary work flow for measurement. The display/input section is adapted to selectively present a maximized workflow display and a reduced workflow display. The maximized workflow display shows a series of operations and works, and further shows a plurality of operations and works in an order that the plurality of operations and works are processed. In a reduced display of the work flow, the reduced workflow display shows details of a specific operation or work, and a position of the specific operation or work in a sequence that the entire series of operations and works are processed.