The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Oct. 24, 2014
Applicant:

Rigaku Corporation, Akishima-shi, Tokyo, JP;

Inventors:

Takuto Sakumura, Hachioji, JP;

Yasukazu Nakaye, Ome, JP;

Assignee:

RIGAKU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 2223/303 (2013.01);
Abstract

A correction information generation method and a correction information generation apparatus enabling easy Flat-Field Correction operation without special accessory equipment are provided. The correction information generation method for performing Flat-Field Correction of X-ray detection sensitivity on a pixel detector, includes the steps of: moving the relative position of a detectorwith respect to an incident X-ray having a cross-sectional beam shape traversing a detection surface so that the whole of the detection surface is irradiated with the incident X-ray in total time and each of pixels arranged in the moving direction is uniformly irradiated; and generating information for correcting the sensitivity of a pixel based on an intensity value detected for a given energy band of the incident X-ray.


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