The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Jan. 13, 2009
Ingo Stuke, Reinfeld, DE;
Til Florian Guenzler, Lingen, DE;
Michael Wuestenbecker, Lutjensee, DE;
Jan Kraemer, Lubeck, DE;
Holger Lux, Bargteheide, DE;
Nicolas Bretzke, Kirchbarkau, DE;
Ingo Stuke, Reinfeld, DE;
Til Florian Guenzler, Lingen, DE;
Michael Wuestenbecker, Lutjensee, DE;
Jan Kraemer, Lubeck, DE;
Holger Lux, Bargteheide, DE;
Nicolas Bretzke, Kirchbarkau, DE;
GE SENSING & INSPECTION TECHNOLOGIES GMBH, Hurth, DE;
Abstract
An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.