The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Sep. 29, 2014
Applicant:
Dieterich Standard, Inc., Boulder, CO (US);
Inventors:
John Henry Stehle, Boulder, CO (US);
Paul Timothy Deegan, Boulder, CO (US);
Dave Craig Winters, Boulder, CO (US);
Assignee:
Dieterich Standard, Inc., Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/25 (2006.01); F16L 23/02 (2006.01); G01L 9/00 (2006.01); G01L 19/00 (2006.01);
U.S. Cl.
CPC ...
F16L 23/02 (2013.01); G01L 9/00 (2013.01); G01L 19/00 (2013.01);
Abstract
Systems, apparatus and methods are disclosed for coupling a wafer style primary element of a process measurement system between process pipes in a manner which aligns the primary element with the process pipes, while maintaining alignment and preventing leaking in the event of a dynamic shock to the process pipes.