The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Mar. 29, 2013
Applicants:

Etienne G. Grossmann, Redwood City, CA (US);

Gaile Gordon, Palo Alto, CA (US);

John I. Woodfill, Palo Alto, CA (US);

Inventors:

Etienne G. Grossmann, Redwood City, CA (US);

Gaile Gordon, Palo Alto, CA (US);

John I. Woodfill, Palo Alto, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/00 (2006.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0246 (2013.01); G06T 5/006 (2013.01); G06T 7/002 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10021 (2013.01);
Abstract

Methods, systems, and computer program products for determining, without interrupting a video processing pipeline, whether currently used warping parameters are appropriate for a multi-camera system. New warping parameters may be determined, where these parameters cause the images rectified with these new parameters to have the desired geometric properties. This determination may be made without interrupting the video processing pipeline. Warping parameters may be determined, for example, such that the epipolar lines of the two cameras are horizontal and properly aligned, as defined below, and the metric 3D position of a point observed by both cameras can be determined and is accurate.


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