The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Oct. 09, 2013
National Instruments Corporation, Austin, TX (US);
Guoqiang Wang, Albany, CA (US);
Kaushik Ravindran, Berkeley, CA (US);
Rhishikesh Limaye, Berkeley, CA (US);
Guang Yang, San Jose, CA (US);
Arkadeb Ghosal, Vacaville, CA (US);
Hugo A. Andrade, El Cerrito, CA (US);
John R. Allen, Los Altos, CA (US);
Jacob Kornerup, Austin, TX (US);
Ian C. Wong, Austin, TX (US);
Jeffrey N. Correll, Cedar Park, TX (US);
Michael J. Trimborn, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for optimizing a data flow diagram based on access pattern information are described. Access pattern information for a data flow diagram may be received. The data flow diagram may include a plurality of interconnected actors, e.g., functional blocks, visually indicating functionality of the data flow diagram. The access pattern information may include one or more of: input pattern information specifying cycles on which tokens are consumed by at least one of the actors, or output pattern information specifying cycles on which tokens are produced by at least one of the actors. A program that implements the functionality of the data flow diagram may be generated based at least in part on the access pattern information.