The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2016

Filed:

Mar. 17, 2014
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Hsu-Shui Liu, Pingjhen, TW;

Yeh-Chieh Wang, Hsinchu, TW;

Jiun-Rong Pai, Jhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G01N 29/14 (2006.01); G01N 29/22 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G05B 19/418 (2013.01); G01N 29/14 (2013.01); G01N 29/226 (2013.01); G01N 29/2481 (2013.01); G01N 29/449 (2013.01); G01N 29/46 (2013.01); H01L 22/26 (2013.01); G01N 2291/2697 (2013.01); H01L 2924/0002 (2013.01);
Abstract

The present disclosure provides an apparatus for fabricating a semiconductor device. The apparatus includes a portable device. The portable device includes first and second sensors that respectively measure first and second fabrication process parameters. The first fabrication process parameter is different from the second fabrication process parameter. The portable device also includes a wireless transceiver that is coupled to the first and second sensors. The wireless transceiver receives the first and second fabrication process parameters and transmits wireless signals containing the first and second fabrication process parameters.


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