The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2016
Filed:
Jul. 11, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Isao Yamazaki, Tokyo, JP;
Hideto Tamezane, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Provided is an automatic analyzer capable of detecting not only clogging and air suction of the dispensation probe but also a decrease in the dispensation quantity caused by a bubble film, air bubbles or a highly viscous sample. Each of a sample/reagent suction operation time and a sample/reagent discharge operation time of a probe is segmented into multiple time sections. For each of the time sections determined by the segmentation, a parameter is calculated by applying a detected pressure waveform to an approximation formula. For each of the time section, the presence/absence of a dispensation abnormality is judged by comparing the calculated parameter with a parameter in cases of normal dispensation. An automatic analyzer capable of judging the presence/absence of an abnormality specific to each time section and making abnormality judgments difficult for conventional techniques can be realized.