The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2016
Filed:
Dec. 06, 2013
Mitutoyo Corporation, Kanagawa-ken, JP;
Eric Herbert Altendorf, Everett, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A chromatic confocal point sensor (CPS) system and associated methods are provided for measuring holes. A CPS optical pen includes a beam dividing deflecting element that directs measurement light simultaneously along at least three directions to the interior surface of the hole. A CPS electronics portion comprises a light generator, a spectrometer, and a signal processor. In operation, the CPS pen directs measurement light to the interior surface along the at least three directions, and the spectrometer receives measurement light reflected from those directions back through the pen and provides a spectral intensity profile comprising spectral peak components corresponding to distances to the interior surface along those directions. The hole characteristic may be determined based at least partially on those distances. The CPS pen may be used as a probe on a coordinate measuring machine (CMM). The CPS pen does not require rotation in a hole to measure the hole.