The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
Apr. 11, 2012
Henry Arnold, Yorba Linda, CA (US);
Pierre Gauthier, Quebec, CA;
Brian Buras, Austin, TX (US);
James Stephen Ledford, Birmingham, AL (US);
Henry Arnold, Yorba Linda, CA (US);
Pierre Gauthier, Quebec, CA;
Brian Buras, Austin, TX (US);
James Stephen Ledford, Birmingham, AL (US);
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
An apparatus for testing a device. The apparatus comprises a test control module and a test analysis module. The test control module is operable to generate and transmit first prober and handler (PH) requests to a supervisor module. The supervisor module is operable to transmit first PH commands to a prober and handler for execution thereof. The test analysis module is operable to generate and transmit second PH requests to the supervisor module. The supervisor module is further operable to transmit second PH commands to the prober and handler for execution thereof. The execution of the second PH commands are performed transparently to the test control module.