The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2016
Filed:
Aug. 06, 2012
Ryohei Ishigami, Tokyo, JP;
Toshihide Orihashi, Tokyo, JP;
Goro Yoshida, Tokyo, JP;
Kenichi Nishigaki, Tokyo, JP;
Hideyuki Yanami, Tokyo, JP;
Ryohei Ishigami, Tokyo, JP;
Toshihide Orihashi, Tokyo, JP;
Goro Yoshida, Tokyo, JP;
Kenichi Nishigaki, Tokyo, JP;
Hideyuki Yanami, Tokyo, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
An automated analyzer includes a conveyance mechanism to convey a specimen, an analysis portion to analyze the specimen, and a device cover to cover a movable mechanism including the conveyance mechanism. The automated analyzer is provided with an interlock mechanism and an interlock release mechanism. The interlock mechanism stops an operation of the movable mechanism when the device cover is opened. The interlock release mechanism disables all or part of the interlock mechanism. The interlock mechanism is enabled when a leveris in contact with a safety switch. The interlock mechanism is disabled or partially disabled when the leveris not in contact with the safety switch. This enables to prevent a user from inadvertently touching the movable mechanism including a hazard region during analysis of the automated analyzer or a maintenance task. Only a specific maintenance task can be performed with the device cover opened.