The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2016

Filed:

Aug. 27, 2013
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Sadato Hongo, Yokohama, JP;

Kentaro Kobayashi, Tokyo, JP;

Hideto Furuyama, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/12 (2006.01); G01N 33/53 (2006.01); G01N 33/543 (2006.01); G01N 33/58 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/12 (2013.01); G01N 15/1031 (2013.01); G01N 33/53 (2013.01); G01N 33/5438 (2013.01); G01N 33/587 (2013.01); G01N 2015/1087 (2013.01); G01N 2015/1093 (2013.01);
Abstract

According to one embodiment, a sample detection apparatus including an insulating partition to divide a first and a second region, a pore formed in the partition, a first electrode arranged in the first region, a second electrode arranged in the second region, a power source configured to apply electrical current between the first and second electrode in a state in which a reagent containing a capture substance to be bound to a target and a tag particle bound to the capture substance is introduced into the first region together with a sample, and an electrolyte solution is introduced into the second region, a measurement unit configured to observe a change in a conductive state, and a detection unit to detect presence/absence of the target in the sample based on an observation result.


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