The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Apr. 06, 2011
Kuniaki Nagayama, Aichi, JP;
Yoshihiro Arai, Tokyo, JP;
Hirofumi Iijima, Tokyo, JP;
Susumu Terakawa, Shizuoka, JP;
Kuniaki Nagayama, Aichi, JP;
Yoshihiro Arai, Tokyo, JP;
Hirofumi Iijima, Tokyo, JP;
Susumu Terakawa, Shizuoka, JP;
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTE OF NATURAL SCIENCES, Tokyo, JP;
Other;
JEOL LTD., Tokyo, JP;
Abstract
A compound microscope device allows simultaneous observation of one specimen by a transmission electron microscope and an optical microscope. The compound microscope deviceof the present invention has a transmission electron microscopeand an optical microscope. A specimenand a reflection mirrorare disposed on an electron optical axis C of an electron ray. The reflection mirroris inclined from the electron optical axis C toward the optical object lensand the specimen. Light from the specimen(fluorescent light, reflection light, and the like) is reflected by the reflection mirrorand enters into the optical object lens. The electron ray from the electron microscopepasses through a mounting center holeof the reflection mirror. This makes it possible to observe one specimen simultaneously by the electron microscopeand the optical microscope