The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Sep. 28, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Fei Wu, Sunnyvale, CA (US);

Mark N. Gamadia, Longmont, CO (US);

Shizhe Shen, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01);
Abstract

Optical characteristics of an optical component for a high volume manufacture consumer electronics device can be tested using a test chart composed of a superposition of two or more groups of parallel line pairs, wherein all the groups of parallel line pairs are oriented at a different inclination. The groups of line pairs could be oriented so that they are perpendicular to each other. A test system can quickly and objectively assess for example the sharpness of the optical component in different directions across a full image field of view of an imaging system that is capturing a digital image of the chart using the optical component for through-the-lens imaging. Other embodiments are also described and claimed.


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