The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Dec. 10, 2010
Applicants:

Kazuya Nabeta, Toyama, JP;

Naoki Ukae, Toyama, JP;

Mitsunori Takeshita, Toyama, JP;

Inventors:

Kazuya Nabeta, Toyama, JP;

Naoki Ukae, Toyama, JP;

Mitsunori Takeshita, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/458 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01L 21/68792 (2013.01); C23C 16/4586 (2013.01); H01J 37/3266 (2013.01); H01J 37/32082 (2013.01); H01L 21/67109 (2013.01); H01L 21/68785 (2013.01);
Abstract

A stable and highly reliable device for detecting damage or contact failures of respective parts is provided. The device includes a processing chamber for processing a substrate; a heater for heating the substrate; a substrate support accommodating the heater and installed inside the processing chamber; a shaft for supporting the substrate support; a wire inserted through the shaft; a supporting unit for holding the wire; and a temperature detector connected to the supporting unit.


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