The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Aug. 28, 2013
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Violante Moschiano, Bacoli, IT;
Giovanni Santin, Rieti, IT;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 16/06 (2006.01); G11C 16/34 (2006.01); G11C 16/24 (2006.01); G11C 16/00 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3436 (2013.01); G11C 11/5628 (2013.01); G11C 16/06 (2013.01); G11C 16/24 (2013.01); G11C 16/3454 (2013.01); G11C 16/3481 (2013.01); G11C 11/56 (2013.01); G11C 16/00 (2013.01); G11C 2029/0409 (2013.01);
Abstract
Apparatus and methods for determining pass/fail condition of memories facilitate array efficiencies. In at least one embodiment, a set of common lines, one for each rank of page buffers corresponding to a page, determine the pass/fail status of all connected memory cells, and the pass/fail status results for each line can be combined to determine a pass/fail for the page of memory.