The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Jun. 25, 2014
Applicant:

Globalfoundries, Inc., Grand Cayman, KY;

Inventors:

Dinesh Koli, Clifton Park, NY (US);

Deepasree Konduparthi, Clifton Park, NY (US);

Assignee:

GLOBALFOUNDRIES, INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/4763 (2006.01); H01L 21/321 (2006.01); H01L 21/3105 (2006.01); H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3212 (2013.01); H01L 21/31053 (2013.01); H01L 27/0886 (2013.01);
Abstract

Devices and methods of forming an integrated circuit and a FinFET device with a planarized permanent layer are provided. In an embodiment, a method of forming a planarized permanent layer includes providing a base substrate that has an uneven surface topography. A permanent layer is conformally formed over the base substrate. The permanent layer includes raised portions and sunken portions that correspond to the surface topography of the base substrate. A sacrificial layer is conformally formed over the permanent layer. The sacrificial layer and the raised portions of the permanent layer are chemical-mechanical planarized to provide the planarized permanent layer. The sacrificial layer is substantially completely removed after chemical-mechanical planarizing.


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