The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Mar. 30, 2012
Darshan Kobla, Austin, TX (US);
David Zimmerman, Folsom, CA (US);
Vimal K. Natarajan, Portland, OR (US);
Darshan Kobla, Austin, TX (US);
David Zimmerman, Folsom, CA (US);
Vimal K. Natarajan, Portland, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A built-in self-test for stacked memory architecture. An embodiment of a memory device includes a memory stack including one or more DRAM (dynamic random access memory) elements; and a system element for control of the memory stack. The system element includes a built-in self-test (BIST) engine to generate a write test event or a read test event for the memory stack, a test interface to receive test data for write test event or the read test events from the BIST engine, and a memory controller, the memory control to receive at least a portion of the test data from the test interface and to implement the write test event or read test event at the DRAM elements of the memory stack.