The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Dec. 23, 2013
Nuctech Company Limited, Haidian District, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuanjing Li, Beijing, CN;
Wanlong Wu, Beijing, CN;
Yingkang Jin, Beijing, CN;
Li Zhang, Beijing, CN;
Le Tang, Beijing, CN;
Chenguang Zhu, Beijing, CN;
Xianli Ding, Beijing, CN;
Xiuwei Chen, Beijing, CN;
Ming Ruan, Beijing, CN;
Chengcong Xu, Beijing, CN;
Xilei Luo, Beijing, CN;
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Abstract
Human body back-scattering inspection systems and methods are disclosed. In the invention, X-rays modulated by the flying-spot forming unit having spirally distributed flying-spots have a distribution having alternating peaks and valleys on the irradiated surface. In this way, scanning starting times can be precisely controlled to cause two devices to have scanning starting times that are different by a half of a cycle. That is, the beams outputted from one device are at maximum when the beams outputted from the other device are at minimum. In other words, even if the ray source of one device emits rays, it will not significantly affect imaging result of the other device. In such way, the two devices may emit rays and perform scanning at the same time, and thus the total scanning time is reduced.