The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Mar. 20, 2015
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Peter A. Gruber, Mohegan Lake, NY (US);

Paul A. Lauro, Brewster, NY (US);

Jae-Woong Nah, New York, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H05K 3/34 (2006.01); H01L 21/48 (2006.01); B23K 1/00 (2006.01); B23K 3/06 (2006.01); H01L 23/498 (2006.01); H01L 21/56 (2006.01); H05K 13/04 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H05K 3/3436 (2013.01); B23K 1/0016 (2013.01); B23K 3/0638 (2013.01); H01L 21/4853 (2013.01); H01L 21/563 (2013.01); H01L 23/49816 (2013.01); H01L 24/11 (2013.01); H01L 24/16 (2013.01); H01L 24/17 (2013.01); H01L 24/81 (2013.01); H05K 3/3494 (2013.01); H05K 13/0465 (2013.01); H01L 24/13 (2013.01); H01L 2224/11011 (2013.01); H01L 2224/131 (2013.01); H01L 2224/13076 (2013.01); H01L 2224/13147 (2013.01); H01L 2224/16113 (2013.01); H01L 2224/16238 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/814 (2013.01); H01L 2224/81065 (2013.01); H01L 2224/81193 (2013.01); H01L 2224/81815 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01049 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01083 (2013.01); H01L 2924/14 (2013.01); H01L 2924/20104 (2013.01); H01L 2924/20106 (2013.01); H01L 2924/20107 (2013.01); H01L 2924/35 (2013.01); H05K 2203/043 (2013.01);
Abstract

Multiple injections of molten solder are employed to form double solder bumps having outer layers that melt at lower temperatures than the inner portions thereof. During a flip chip assembly process, the reflow temperature is above the melting temperature of the outer layers and below the melting temperature of the inner portions of the solder bumps. As the inner portions of the solder bumps do not collapse during reflow, a flip chip assembly can be made at relatively low temperatures and have a high stand-off height. A structure having double solder bumps facilitates flip chip assembly.


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