The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2016

Filed:

Feb. 25, 2015
Applicants:

Keisuke Takizawa, Atsugi, JP;

Reiichi Hashimoto, Atsugi, JP;

Inventors:

Keisuke Takizawa, Atsugi, JP;

Reiichi Hashimoto, Atsugi, JP;

Assignee:

Anritsu Corporation, Atsugi-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04W 24/06 (2013.01);
Abstract

According to one embodiment, a test apparatus includes a reception buffer configured to store uplink data, a transmission buffer configured to store downlink data, an arithmetic processing module configured to execute reception arithmetic processing on the uplink data read from the reception buffer, and to execute transmission arithmetic processing to generate downlink data and store the generated downlink data in the transmission buffer, and a management module configured to provide, under a first predetermined condition, the arithmetic processing module with a first instruction to execute the reception arithmetic processing, and to provide, under a second predetermined condition, the transmitting/receiving module with a second instruction to transmit the downlink data stored in the transmission buffer.


Find Patent Forward Citations

Takizawa, Keisuke. (2016). Test apparatus and test method (U.S. Patent No. 9294945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9294945

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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