The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Dec. 05, 2012
Mitutoyo Corporation, Kanagawa, JP;
Takeshi Sawa, Kawasaki, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
The present invention provides a hardness tester capable of accurately detecting a point where an indenter contacts a sample in instrumented indentation testing. Prior to beginning measurement, the hardness tester defines an expected range for a value for a displacement, speed, or acceleration of an indenter during a process of approaching a sample. After measurement has begun, the hardness tester measures the value for the displacement, speed, or acceleration of the indenter during the process of approaching the sample. When the measured value is not within the expected range, the hardness tester determines that detection of a zero point has failed.