The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Jun. 28, 2013
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Xue Yang, Arcadia, CA (US);

Lei Yang, Hillsboro, OR (US);

Aveek Purohit, Moffett Field, CA (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/04 (2009.01); H04W 64/00 (2009.01); H04W 4/02 (2009.01);
U.S. Cl.
CPC ...
H04W 4/04 (2013.01); H04W 4/028 (2013.01); H04W 64/00 (2013.01); H04W 4/02 (2013.01);
Abstract

A method of detecting a revisit position includes receiving at a computing system a plurality of position data points, each of the plurality of position data points including a signal scan measurement. The method farther includes calculating a first signal distance between a first signal scan measurement corresponding to a first position data point of the plurality of position data points and a second signal scan measurement corresponding to a second position data point of the plurality of position data points. The method further includes determining that the first signal distance is less than a first threshold, that the first signal distance is a local minimum for the first position data point, and the first signal distance is a local minimum for the second position data point. The method further includes, based on the determining, identifying the first and second position data points as revisit points.


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