The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Feb. 06, 2013
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Yohei Kawaguchi, Hachioji, JP;
Yuichiro Hashimoto, Tachikawa, JP;
Masuyuki Sugiyama, Hino, JP;
Shun Kumano, Kokubunji, JP;
Akihito Kaneko, Kawasaki, JP;
Masahito Togami, Higashiyamato, JP;
Kazushige Nishimura, Kokubunji, JP;
Hiroyuki Inoue, Kashiwa, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.