The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Jun. 12, 2014
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Jeffrey A. Kessenich, Vancouver, WA (US);

Joemar Sinipete, Boise, ID (US);

Chiming Chu, Boise, ID (US);

Jason L. Nevill, Boise, ID (US);

Kenneth W. Marr, Boise, ID (US);

Renato C. Padilla, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 8/08 (2006.01); G11C 7/00 (2006.01); G11C 7/02 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G11C 29/04 (2006.01); G01R 31/02 (2006.01); G11C 16/10 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/04 (2013.01); G01R 31/02 (2013.01); G11C 7/00 (2013.01); G11C 7/02 (2013.01); G11C 8/08 (2013.01); G11C 16/10 (2013.01); G11C 29/02 (2013.01); G11C 29/025 (2013.01); G11C 29/50008 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/5006 (2013.01);
Abstract

Methods of operating a memory device having embedded leak checks may mitigate data loss events due to access line defects, and may facilitate improved power consumption characteristics. Such methods might include applying a program pulse to a selected access line coupled to a memory cell selected for programming, verifying whether the selected memory cell has reached a desired data state, bringing the selected access line to a first voltage, applying a second voltage to an unselected access line, applying a reference current to the selected access line, and determining if a current flow between the selected access line and the unselected access line is greater than the reference current.


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