The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Aug. 01, 2013
Applicant:

Integrated Silicon Solution, Inc., Milpitas, CA (US);

Inventors:

Wing-Hin Kao, San Jose, CA (US);

Jongsik Na, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1048 (2013.01);
Abstract

A memory device using error correction code (ECC) implements a memory array parallel read-write method to reduce the storage overhead required for storing ECC check bits. The memory array parallel read-write method stores incoming address and data into serial-in parallel-out (SIPO) address registers and write data registers, respectively. The stored data are written to the memory cells in parallel when the SIPO registers are full. ECC check bits are generated for the block of parallel input data stored in the write data registers. During the read operation, a block of read out data corresponding to the read address are read from the memory cells in parallel and stored in read registers. ECC correction is performed on the block of read out data before the desired output data is selected for output.


Find Patent Forward Citations

Loading…