The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Dec. 31, 2011
Roy E. Swart, Hillsboro, OR (US);
Warren S. Crippen, Aloha, OR (US);
Charlotte C. Kwong, Beaverton, OR (US);
David Shia, Hillsboro, OR (US);
Roy E. Swart, Hillsboro, OR (US);
Warren S. Crippen, Aloha, OR (US);
Charlotte C. Kwong, Beaverton, OR (US);
David Shia, Hillsboro, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.