The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Sep. 16, 2011
Applicant:
Rolf Wartmann, Waake, DE;
Inventor:
Rolf Wartmann, Waake, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01C 11/02 (2006.01); G02B 13/22 (2006.01); G02B 21/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01C 11/02 (2013.01); G02B 13/22 (2013.01); G02B 21/22 (2013.01);
Abstract
A device for three-dimensional measurement of an object, with a stereomicroscope of the telescope type, which has a common objective and a first and a second tube lens, a first image sensor, which is assigned to the first tube lens, a second image sensor (), which is assigned to the second tube lens, and a control unit, which determines the three-dimensional shape of the object from the images obtained with the two image sensors and carries out a predetermined three-dimensional measurement, wherein the stereomicroscope is designed such that the images are obtained with object-side telecentric conditions of the stereomicroscope.