The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

May. 29, 2012
Applicants:

Matthew T. Kuiken, Goleta, CA (US);

Stephen H. Black, Buellton, CA (US);

Inventors:

Matthew T. Kuiken, Goleta, CA (US);

Stephen H. Black, Buellton, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/365 (2011.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/3651 (2013.01); H04N 5/23293 (2013.01);
Abstract

An infrared thermal imaging system includes a focal plane array (FPA) of infrared detectors, read out integrated circuitry (ROIC) operatively coupled to the FPA, and a microcontroller having at least one video display interface operatively coupled to the ROIC. The FPA is configured to generate an output signal in response to infrared radiation impinging upon the infrared detectors. The microcontroller is configured to send data to the ROIC via the at least one video display interface, the data including non-uniformity correction terms for correcting non-uniformities of the FPA.


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