The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Jan. 20, 2010
Gil Golov, Backnang, DE;
Thomas Henkel, Böblingen, DE;
Ronald Larson, Fort Collins, CO (US);
Ulrich Knoch, Herrenberg, DE;
Gil Golov, Backnang, DE;
Thomas Henkel, Böblingen, DE;
Ronald Larson, Fort Collins, CO (US);
Ulrich Knoch, Herrenberg, DE;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.