The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Jan. 27, 2014
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Johannes Mueller, Dresden, DE;

Dina H. Triyoso, Dresden, DE;

Robert Binder, Dresden, DE;

Joachim Metzger, Butzbach, DE;

Patrick Polakowski, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/00 (2006.01); H01L 29/51 (2006.01); H01L 21/02 (2006.01); H01L 21/3105 (2006.01); H01L 27/115 (2006.01);
U.S. Cl.
CPC ...
H01L 29/516 (2013.01); H01L 21/0228 (2013.01); H01L 21/02181 (2013.01); H01L 21/02186 (2013.01); H01L 21/02266 (2013.01); H01L 21/3105 (2013.01); H01L 27/11507 (2013.01); H01L 29/511 (2013.01); H01L 29/517 (2013.01); H01L 29/518 (2013.01);
Abstract

The present disclosure provides a semiconductor device comprising a substrate, an undoped HfOlayer formed over the substrate and a TiN layer formed on the HfOlayer. Herein, the undoped HfOlayer is at least partially ferroelectric. In illustrative methods for forming a semiconductor device, an undoped amorphous HfOlayer is formed over a semiconductor substrate and a TiN layer is formed on the undoped amorphous HfOlayer. A thermal annealing process is performed for at least partially inducing a ferroelectric phase in the undoped amorphous HfOlayer.


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