The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
May. 07, 2012
Applicants:
Lei Yuan, Sunnyvale, CA (US);
Hidekazu Yoshida, San Jose, CA (US);
Youngtag Woo, San Ramon, CA (US);
Jongwook Kye, Pleasanton, CA (US);
Inventors:
Lei Yuan, Sunnyvale, CA (US);
Hidekazu Yoshida, San Jose, CA (US);
Youngtag Woo, San Ramon, CA (US);
Jongwook Kye, Pleasanton, CA (US);
Assignee:
GLOBALFOUNDRIES, INC., Grand Cayman, KY;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5077 (2013.01); G06F 2217/12 (2013.01);
Abstract
A process for manufacturing integrated circuit devices includes providing a set of original color rules defining an original color rule space and defining a design space. The improvement involves applying a perturbed color rule space to the router processing engine to expose double pattern routing odd cycle decomposition errors, and reconfiguring the router processing engine in accordance with the exposed decomposition errors.