The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2016

Filed:

Mar. 26, 2015
Applicant:

Asahi Glass Company, Limited, Tokyo, JP;

Inventor:

Yoshiaki Ikuta, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/24 (2012.01); G03F 1/22 (2012.01); G03F 1/38 (2012.01); G03F 1/72 (2012.01); G03F 1/78 (2012.01);
U.S. Cl.
CPC ...
G03F 1/24 (2013.01); G03F 1/22 (2013.01); G03F 1/38 (2013.01); G03F 1/72 (2013.01); G03F 1/78 (2013.01);
Abstract

A method of manufacturing a reflective mask blank for EUV lithography with a resist film, includes preparing a reflective mask blank provided with three or more concave or convex fiducial marks each formed by at least two lines placed to extend along any one of virtual lines that cross at an intersection point, at least one of the lines of the fiducial mark being placed to extend along each of the virtual lines; forming a resist film on the reflective mask blank; detecting fiducial positions corresponding to the intersection points of the fiducial marks by scanning with an electron beam or an ultraviolet light; and exposing specific areas of the resist film including circular areas centered at the fiducial positions of the respective fiducial marks with a radius of 1.5W, where W is the maximum value of a width of the line of the respective fiducial marks.


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