The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2016
Filed:
Mar. 01, 2013
Isp Investments Inc., Wilmington, DE (US);
David Fairhurst Lewis, Monroe, CT (US);
Andre Micke, Chatham, NJ (US);
Xiang Yu, Bridgewater, NJ (US);
ISP INVESTMENTS INC., Wilmington, DE (US);
Abstract
The present invention provides a method for measuring a two-dimensional distribution of ionizing radiation doses with high spatial resolution. The method comprises exposing radiation sensitive film to a pattern of ionizing radiation to form a measurement film, exposing areas of radiation sensitive film to a plurality of known doses of the ionizing radiation to form a calibration film(s), scanning all the exposed films together with an unexposed radiation sensitive film at a single time to produce a digital image, measuring those areas of the digital image corresponding to the unexposed film and the calibration film(s) exposed to different known doses, associating the measured responses in the areas to the known doses and using the association to convert the values in the scanned image corresponding to the measurement film from scanner response values to dose values. In a preferred embodiment, all of the radiation sensitive films are the same type of film.