The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Feb. 19, 2015
Applicant:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Inventors:

Haiqiang Wang, Shanghai, CN;

Xianyong Pu, Shanghai, CN;

Yong Cheng, Shanghai, CN;

Zonggao Chen, Shanghai, CN;

Yiqun Chen, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/266 (2006.01); H01L 21/8238 (2006.01); H01L 29/66 (2006.01); H01L 29/167 (2006.01); H01L 21/306 (2006.01); H01L 21/308 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 21/266 (2013.01); H01L 21/3081 (2013.01); H01L 21/30604 (2013.01); H01L 21/76224 (2013.01); H01L 21/823878 (2013.01); H01L 21/823892 (2013.01); H01L 29/167 (2013.01); H01L 29/66681 (2013.01);
Abstract

A method for manufacturing a semiconductor device may include the following steps: preparing a semiconductor substrate that includes a first substrate region, a second substrate region, and a third substrate region; providing a first mask that overlaps the semiconductor substrate; etching, using the first mask, the first semiconductor substrate to form a trench in each of the substrate regions; providing a second mask that overlaps the semiconductor substrate and includes three openings corresponding to the substrate regions; performing first ion implantation through the three openings to form a P-doped region in each of the substrate regions; performing second ion implantation through the three openings to form an N-doped region in each of the substrate regions; and performing third ion implantation through the three openings to form another N-doped region in each of the substrate regions; and forming an isolation member in each of the trenches.


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