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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9261475 B1

PDFFull Text
Expired
Date of Patent:
Feb. 16, 2016

Filed:

Jun. 17, 2011

Inspection equipment and inspection method

Applicants:

Masami Makuuchi, Yokohama, JP;

Minori Noguchi, Joso, JP;

Hiroshi Kawaguchi, Hitachinaka, JP;

Inventors:

Masami Makuuchi, Yokohama, JP;

Minori Noguchi, Joso, JP;

Hiroshi Kawaguchi, Hitachinaka, JP;

Assignee:

Hitachi High-Technologies Corporation, Tokyo, JP;

Attorney:

Crowell & Moring LLP

Primary Examiner:

Melissa Koval

Assistant Examiner:

Courtney McDonnough

Int. Cl.
CPC ...
G01N 27/24 (2006.01); H01M 10/42 (2006.01); H01M 10/44 (2006.01); H01M 10/48 (2006.01); H01M 10/052 (2010.01); H01M 10/058 (2010.01);
U.S. Cl.
CPC ...
G01N 27/24 (2013.01); H01M 10/4285 (2013.01); H01M 10/44 (2013.01); H01M 10/48 (2013.01); H01M 10/052 (2013.01); H01M 10/058 (2013.01); Y02T 10/7011 (2013.01);
Abstract

Foreign metal inspection equipment is provided with: a conveying device for conveying a sample to be subjected to inspection; electrodes positioned so as to face the surface of the sample; a measurement device for measuring the capacitance between the electrodes and the sample being conveyed by the conveying device; and a processing unit that inspects for foreign metal mixed in the sample on the basis of the change in capacitance measured by the measurement device.

Find Patent Forward Citations

Makuuchi, Masami. (2016). Inspection equipment and inspection method (U.S. Patent No. 9261475). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9261475

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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