The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Jun. 17, 2011
Applicants:
Masami Makuuchi, Yokohama, JP;
Minori Noguchi, Joso, JP;
Hiroshi Kawaguchi, Hitachinaka, JP;
Inventors:
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/24 (2006.01); H01M 10/42 (2006.01); H01M 10/44 (2006.01); H01M 10/48 (2006.01); H01M 10/052 (2010.01); H01M 10/058 (2010.01);
U.S. Cl.
CPC ...
G01N 27/24 (2013.01); H01M 10/4285 (2013.01); H01M 10/44 (2013.01); H01M 10/48 (2013.01); H01M 10/052 (2013.01); H01M 10/058 (2013.01); Y02T 10/7011 (2013.01);
Abstract
Foreign metal inspection equipment is provided with: a conveying device for conveying a sample to be subjected to inspection; electrodes positioned so as to face the surface of the sample; a measurement device for measuring the capacitance between the electrodes and the sample being conveyed by the conveying device; and a processing unit that inspects for foreign metal mixed in the sample on the basis of the change in capacitance measured by the measurement device.