The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Dec. 30, 2014
Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, CN;
Liang Qian, Shanghai, CN;
Abstract
A method and an apparatus for testing a memory are provided, where the memory includes a plurality of sectors each of which includes a plurality of bytes, and the testing is performed to the memory byte by byte. The method includes: during the testing, once a first byte in a first sector fails the testing, stopping testing the rest bytes in the first sector which haven't been tested, and skipping the testing to a second byte in a second sector. Accordingly, if one byte of the first sector fails the testing, the testing will be skipped to a second sector, and the remained bytes of the first sector will not be tested any more, and other testing items will not be implemented to the first sector within the whole testing flow. Therefore, redundant testing steps can be avoided and testing efficiency can be improved.