The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Apr. 02, 2012
Applicants:
Gerard Coquerel, Boos, FR;
Morgane Sanselme, Bois Guillaume, FR;
Anais Lafontaine, Rouen, FR;
Inventors:
Assignee:
UNIVERSITE DE ROUEN, Mont-saint-aignan, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01N 23/203 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/203 (2013.01); G01N 23/20 (2013.01); G01N 23/207 (2013.01); G01N 23/20033 (2013.01); G01N 2223/056 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/602 (2013.01); G01N 2223/639 (2013.01);
Abstract
The present invention relates to a method and a device for measuring scattering of X-rays wherein the compound to be analyzed is installed in a receptacle comprising an X-ray-permeable flat bottom, wherein the X-ray diffraction analysis is undertaken by sending an X-ray stream upwards toward said X-ray-permeable bottom and by measuring the stream of scattered X-rays reflected downwards, and wherein a fluid thermostatically controlled to the same temperature as that of the compound to be analyzed in the receptacle is projected toward the X-ray permeable flat bottom, from outside the receptacle.